Issue 2, 2022

Defective porous carbon microrods derived from fullerenes (C70) as high-performance electrocatalysts for the oxygen reduction reaction

Abstract

Disrupting the integrity of the sp2-carbon skeleton offers an effective strategy to create active sites for the oxygen reduction reaction (ORR). In this work, fullerene (C70) molecules, composed of 12 pentagons and 25 hexagons all bonded by sp2-C atoms, are assembled into microrods (C70MRs) at the liquid–liquid interface and then broken down by calcination to generate metal-free fullerene-derived ORR electrocatalysts. The effect of the pyrolysis temperature on C70MRs is investigated, and it is found that pyrolysis at 900 °C effectively unfolds the C70 cages and converts them into a highly porous, defect-rich carbon material (C70MRs-900) with the rod-shaped morphology well-retained. These structural features endow C70MRs-900 with outstanding ORR activity and stability together with remarkable methanol tolerance, better than C70MRs annealed at either lower (800 °C) or higher (1000 °C) temperatures. Furthermore, nitrogen atoms are successfully incorporated into the defective carbon skeleton by annealing C70MRs at 900 °C in the presence of NH4Cl. The resultant N-doped C70MRs-900 exhibits remarkable ORR performance with a half-wave potential of 0.836 V, comparable to that of the commercial 20% Pt/C catalyst. This work presents a simple and effective route of utilizing fullerene molecules as starting materials to develop high-performance metal-free, carbon-based electrocatalysts toward the ORR and even beyond.

Graphical abstract: Defective porous carbon microrods derived from fullerenes (C70) as high-performance electrocatalysts for the oxygen reduction reaction

Supplementary files

Article information

Article type
Paper
Submitted
01 Nov 2021
Accepted
28 Nov 2021
First published
02 Dec 2021

Nanoscale, 2022,14, 473-481

Defective porous carbon microrods derived from fullerenes (C70) as high-performance electrocatalysts for the oxygen reduction reaction

Z. He, P. Wei, T. Xu, Z. Guo, J. Han, T. Akasaka, K. Guo and X. Lu, Nanoscale, 2022, 14, 473 DOI: 10.1039/D1NR07198J

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