Issue 47, 2022

Mexican-hat dispersions and high carrier mobility of γ-SnX (X = O, S, Se, Te) single-layers: a first-principles investigation

Abstract

The shape of energy dispersions near the band-edges plays a decisive role in the transport properties, especially the carrier mobility, of semiconductors. In this work, we design and investigate the γ phase of tin monoxide and monochalcogenides γ-SnX (X = O, S, Se, and Te) through first-principles simulations. γ-SnX is found to be dynamically stable with phonon dispersions containing only positive phonon frequencies. Due to the hexagonal atomic lattice, the mechanical properties of γ-SnX single-layers are directionally isotropic and their elastic constants meet Born's criterion for mechanical stability. Our calculation results indicate that all four single-layers of γ-SnX are semiconductors with the Mexican-hat dispersions. The biaxial strain not only greatly changes the electronic structures of the γ-SnX single-layers, but also can cause a phase transition from semiconductor to metal. Meanwhile, the effects of an electric field on the electron states of γ-SnX single-layers are insignificant. γ-SnX structures have high electron mobility and their electron mobility is highly directional isotropic along the two transport directions x and y. The findings not only initially introduce the γ phase of group IV–VI compounds, but also serve as a premise for further studies on this material family with potential applications in the future, both theoretically and experimentally.

Graphical abstract: Mexican-hat dispersions and high carrier mobility of γ-SnX (X = O, S, Se, Te) single-layers: a first-principles investigation

Article information

Article type
Paper
Submitted
13 Sep 2022
Accepted
08 Nov 2022
First published
09 Nov 2022

Phys. Chem. Chem. Phys., 2022,24, 29064-29073

Mexican-hat dispersions and high carrier mobility of γ-SnX (X = O, S, Se, Te) single-layers: a first-principles investigation

V. V. Tuan, A. A. Lavrentyev, O. Y. Khyzhun, N. T. T. Binh, N. V. Hieu, A. I. Kartamyshev and N. N. Hieu, Phys. Chem. Chem. Phys., 2022, 24, 29064 DOI: 10.1039/D2CP04265G

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