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Corresponding authors
a
Chemical Science & Technology Division, CSIR-North East Institute of Science & Technology, Jorhat, Assam-785006, India
E-mail:
ocsgin@gmail.com
b
Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, Uttar Pradesh, India
c
PV Metrology Group, Advanced Materials Devices and Metrology Division, CSIR-National Physical Laboratory, New Delhi-110012, India
d
Academy of Scientific and Innovative Research (AcSIR), CSIR-NPL Campus, New Delhi-110012, India
e
Advanced Computation and Data Sciences Division, CSIR-North East Institute of Science & Technology, Jorhat, Assam-785006, India
f
International Center for Materials and Nanoarchitectronics (MANA) and Research Center for Advanced Measurement and Characterization (RCAMC), National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Japan
g
Research Center for Advanced Measurement and Characterization (RCAMC), National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Japan