Comment on “Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling” by C. Van Dyck, A. J. Bergren, V. Mukundan, J. A. Fereiro and G. A. DiLabio, Phys. Chem. Chem. Phys., 2019, 21, 16762

Abstract

Misinterpretation of scanning tunnelling microscopy results yielded incorrect conclusions about the flatness of a carbon electrode substrate used for molecular electronic devices. Furthermore, the results are not supported statistically and likely not representative of materials used in numerous publications.