Issue 33, 2020

A systematic study of Ga- and N-polar GaN nanowire–shell growth by metal organic vapor phase epitaxy

Abstract

Metal organic vapor-phase epitaxy of GaN shells on N- and Ga-polar nanowires on AlN/Si(111) templates has been studied in detail. A polarity-dependent epitaxial optimization of nitride-based core–shell structures is necessary to attain the desired shell shape. On N-polar wires, a maximal shell length has been achieved using N2, only, as a carrier gas, while the length decreases by substitution of N2 with H2. A strong impact of the NW growth template polarity has been observed, which has to be considered to attain the desired shell shape. On Ga-polar wires under pure N2, an exclusive coverage of the wire tip occurs. Shell growth and an increasing shell length are obtained by injecting increased H2 flows. The semi-polar {10[1 with combining macron]1} and polar (000[1 with combining macron]) planes have been identified as the facets that limit the vertical shell length growth evolution on the N- and Ga-polar core–shell structures, respectively. Meanwhile, the m-planar lateral growth mode is found to be identical for both types of polarities. The data are used to set up a growth model that includes the facet-dependent termination, carrier-gas dependent H-passivation, Ga-adatom length and Ga-adlayer formation, and the thereby adjusted three-dimensional growth and shell shape for both polarities. The attained insights and the developed technology allow the epitaxy of homogeneous complex crystal architectures, mandatory for optimized nitride core–shell NW-based devices.

Graphical abstract: A systematic study of Ga- and N-polar GaN nanowire–shell growth by metal organic vapor phase epitaxy

Supplementary files

Article information

Article type
Paper
Submitted
09 May 2020
Accepted
14 Jul 2020
First published
06 Aug 2020

CrystEngComm, 2020,22, 5522-5532

A systematic study of Ga- and N-polar GaN nanowire–shell growth by metal organic vapor phase epitaxy

C. Blumberg, P. Häuser, F. Wefers, D. Jansen, F. Tegude, N. Weimann and W. Prost, CrystEngComm, 2020, 22, 5522 DOI: 10.1039/D0CE00693A

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