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Issue 13, 2019
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An accurate measurement of the dipole orientation in various organic semiconductor films using photoluminescence exciton decay analysis

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Abstract

In this study, we report an accurate and more reliable approach to estimate the dipole orientation of emitters especially phosphorescence, fluorescence and even thermally activated delayed fluorescence. The dipole orientation measurements are performed by examining the variation of the photoluminescence (PL) exciton decay rate from time-resolved PL and optical analysis. Our anisotropic dipole orientation results are consistent with those of previous reports. The studied measurement approach is very reliable and accurate to estimate the dipole orientation of any organic semiconductor materials regardless of whether they are doped or neat films.

Graphical abstract: An accurate measurement of the dipole orientation in various organic semiconductor films using photoluminescence exciton decay analysis

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Publication details

The article was received on 18 Feb 2019, accepted on 04 Mar 2019 and first published on 04 Mar 2019


Article type: Paper
DOI: 10.1039/C9CP00965E
Citation: Phys. Chem. Chem. Phys., 2019,21, 7083-7089

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    An accurate measurement of the dipole orientation in various organic semiconductor films using photoluminescence exciton decay analysis

    I. J. Ko, H. Lee, J. H. Park, G. W. Kim, R. Lampande, R. Pode and J. H. Kwon, Phys. Chem. Chem. Phys., 2019, 21, 7083
    DOI: 10.1039/C9CP00965E

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