Issue 58, 2018, Issue in Progress

Oxide removal and stabilization of bismuth thin films through chemically bound thiol layers

Abstract

Bismuth has been identified as a material of interest for electronic applications due to its extremely high electron mobility and quantum confinement effects observed at nanoscale dimensions. However, it is also the case that Bi nanostructures are readily oxidised in ambient air, necessitating additional capping steps to prevent surface re-oxidation, thus limiting the processing potential of this material. This article describes an oxide removal and surface stabilization method performed on molecular beam epitaxy (MBE) grown bismuth thin-films using ambient air wet-chemistry. Alkanethiol molecules were used to dissolve the readily formed bismuth oxides through a catalytic reaction; the bare surface was then reacted with the free thiols to form an organic layer which showed resistance to complete reoxidation for up to 10 days.

Graphical abstract: Oxide removal and stabilization of bismuth thin films through chemically bound thiol layers

Supplementary files

Article information

Article type
Paper
Submitted
15 Aug 2018
Accepted
10 Sep 2018
First published
27 Sep 2018
This article is Open Access
Creative Commons BY-NC license

RSC Adv., 2018,8, 33368-33373

Oxide removal and stabilization of bismuth thin films through chemically bound thiol layers

G. Alessio Verni, B. Long, F. Gity, M. Lanius, P. Schüffelgen, G. Mussler, D. Grützmacher, J. Greer and J. D. Holmes, RSC Adv., 2018, 8, 33368 DOI: 10.1039/C8RA06840B

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