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Effect of substrate orientation on local magnetoelectric coupling in bi-layered multiferroic thin films

Abstract

In this study we explore the prospect of strain-mediated magnetoelectric coupling in CoFe2O4-BaTiO3 bi-layers as a function of different interfacial boundary conditions. Pulsed laser deposition fabricated thin films on Nb:SrTiO3(100) and Nb:SrTiO3(111) single crystal substrates were characterized in terms of their peculiarities related to structure property relationship. Despite of a homogeneous phase formation in both films, transmission electron microscopy showed that the bi-layers on Nb:SrTiO3(100) exhibit a higher number of crystallographic defects when compared to the films on Nb:SrTiO3(111). This signifies an intrinsic relationship of the defects and the substrate orientation. To analyze the consequences of these defects on the overall magnetoelectric coupling of the bi-layered films, Piezoresponse Force Microscopy was performed in-situ with an applied magnetic field. The local magnetic field dependence of piezoresponse was obtained using Principal Component Analysis. A detailed analysis of this dependence lead to a conclusion that the bi-layers on Nb:SrTiO3(111) exhibit better strain-transfer characteristics between the magnetic and the piezoelectric layer than those which were deposited on Nb:SrTiO3(100). This strain transfer characteristics correlate well with the interface quality and the defect concentration. This study suggests that in terms of overall magnetoelectric coupling, the Nb:SrTiO3(111) grown bi-layers are expected to outperform their Nb:SrTiO3(100) grown counterparts.

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Publication details

The article was received on 26 Jul 2018, accepted on 11 Oct 2018 and first published on 11 Oct 2018


Article type: Paper
DOI: 10.1039/C8NR06041J
Citation: Nanoscale, 2018, Accepted Manuscript
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    Effect of substrate orientation on local magnetoelectric coupling in bi-layered multiferroic thin films

    M. Naveed-Ul-Haq, S. Webers, H. Trivedi, S. Salamon, H. Wende, M. Usman, A. Mumtaz, V. Shvartsman and D. C. Lupascu, Nanoscale, 2018, Accepted Manuscript , DOI: 10.1039/C8NR06041J

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