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Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires

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Abstract

Metastable germanium–tin alloys are promising materials for optoelectronics and optics. Here we present the first electrical characterization of highly crystalline Ge0.81Sn0.19 nanowires grown in a solution-based process. The investigated Ge0.81Sn0.19 nanowires reveal ohmic behavior with resistivity of the nanowire material in the range of ∼1 × 10−4 Ω m. The temperature-dependent resistivity measurements demonstrate the semiconducting behavior. Moreover, failure of devices upon heating to moderate temperatures initiating material degradation has been investigated to illustrate that characterization and device operation of these highly metastable materials have to be carefully conducted.

Graphical abstract: Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires

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Publication details

The article was received on 01 Jul 2018, accepted on 18 Sep 2018 and first published on 12 Oct 2018


Article type: Paper
DOI: 10.1039/C8NR05296D
Citation: Nanoscale, 2018, Advance Article
  • Open access: Creative Commons BY license
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    Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires

    M. Sistani, M. S. Seifner, M. G. Bartmann, J. Smoliner, A. Lugstein and S. Barth, Nanoscale, 2018, Advance Article , DOI: 10.1039/C8NR05296D

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