Issue 32, 2018
From the journal:

Chemical Communications

Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution†

Le Yang,a   Hao-Sen Chen, ORCID logo *b   Hanqing Jiang,c   Yu-Jie Wei,d   Wei-Li Song ORCID logo *b  and  Dai-Ning Fangab  

* Corresponding authors

a State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing, China

b State Key Laboratory of Explosion Science and Technology, Institute of Advanced Structure Technology, Beijing Institute of Technology, Beijing 100081, China
E-mail: chenhs@bit.edu.cn, weilis@bit.edu.cn

c School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287, USA

d LNM, Institute of Mechanics, Chinese Academy of Sciences, Beijing 100190, China

Abstract

An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.

Graphical abstract: Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution

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Article information

DOI
https://doi.org/10.1039/C7CC09708E
Article type
Communication
Submitted
19 Dec 2017
Accepted
23 Mar 2018
First published
26 Mar 2018

Chem. Commun., 2018,54, 3997-4000

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Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution

L. Yang, H. Chen, H. Jiang, Y. Wei, W. Song and D. Fang, Chem. Commun., 2018, 54, 3997 DOI: 10.1039/C7CC09708E

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