Thermal resistances of thin films of small molecule organic semiconductors

Abstract

We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.