Issue 41, 2016

Conduction band discontinuity and carrier multiplication at the MgxZn1−xO/MgyZn1−yO interface

Abstract

Carrier multiplication is one process for improving the performance of deep ultraviolet (DUV) photodetectors. Conduction band discontinuity can make electrons obtain additional kinetic energy by potential energy (equal to ΔEC) reducing, and then have sufficient energy to impact a lattice generating electron–hole pairs to increase the internal photocurrent. An active layer consisting of four-period graded bandgap MgZnO with a steep MgxZn1−xO/MgyZn1−yO heterointerface, in which an impact ionization process takes place, has been demonstrated. The fabricated photodetector shows a DUV detection capability with a cutoff wavelength at ∼280 nm. The peak responsivity at about 250 nm nonlinearly increases with the applied reverse bias.

Graphical abstract: Conduction band discontinuity and carrier multiplication at the MgxZn1−xO/MgyZn1−yO interface

Article information

Article type
Communication
Submitted
01 Feb 2016
Accepted
30 Mar 2016
First published
01 Apr 2016

RSC Adv., 2016,6, 34955-34958

Conduction band discontinuity and carrier multiplication at the MgxZn1−xO/MgyZn1−yO interface

X. Xie, B. Li, Z. Zhang, S. Wang and D. Shen, RSC Adv., 2016, 6, 34955 DOI: 10.1039/C6RA02919A

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