Seeing is believing: atomic force microscopy imaging for nanomaterial research

Abstract

The research and development of nanotechnology has led to materials science and engineering entering the “nanomaterial era”. It is pivotal for analyzing the physicochemical properties of nanomaterials for new nanotechnological instruments to be developed. Over the past three decades, atomic force microscopy (AFM), as a powerful nanotechnological imaging tool, has provided many imaging modes for analyzing nanomaterial properties such as the topography, elasticity, adhesion, friction, electrical properties, and magnetism of the materials. The focus of this review is on the development of AFM imaging observation tools and methods for nanomaterial research. First, AFM and nanomaterials are briefly introduced. Then, AFM imaging techniques for nanomaterial research are comprehensively summarized. Finally, the advantages and disadvantages of AFM imaging techniques for nanomaterial research are discussed. This review will provide comprehensive information of AFM imaging techniques for materials scientists and engineers.