Issue 19, 2016

Rapid vapour deposition and in situ melt crystallization for 1 min fabrication of 10 μm-thick crystalline silicon films with a lateral grain size of over 100 μm

Abstract

We developed a film deposition method which yielded continuous polycrystalline Si films with large lateral grain sizes of over 100 μm and thicknesses of ∼10 μm in 1 min on growth substrates other than silicon wafers in a single-step process. The silicon source is heated to ∼2000 °C, much higher than the melting point of Si, which enables a high deposition rate. Controlling the temperature of the growth substrate, initially above and later below the melting point of Si, allows the seamless lateral to vertical growth of crystalline silicon grains. Thermally and chemically stable substrates of quartz glass and alumina with a 0.1 μm-thick amorphous carbon layer were effective; liquid silicon wetted well by forming a thin SiC interlayer while substrates stayed stable. Such large-grain polycrystalline silicon films synthesized rapidly in 1 min may be used for low-cost, stable and flexible thin film photovoltaic cells.

Graphical abstract: Rapid vapour deposition and in situ melt crystallization for 1 min fabrication of 10 μm-thick crystalline silicon films with a lateral grain size of over 100 μm

Supplementary files

Article information

Article type
Paper
Submitted
17 Jan 2016
Accepted
05 Apr 2016
First published
06 Apr 2016
This article is Open Access
Creative Commons BY license

CrystEngComm, 2016,18, 3404-3410

Rapid vapour deposition and in situ melt crystallization for 1 min fabrication of 10 μm-thick crystalline silicon films with a lateral grain size of over 100 μm

Y. Yamasaki, K. Hasegawa, T. Osawa and S. Noda, CrystEngComm, 2016, 18, 3404 DOI: 10.1039/C6CE00122J

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