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Issue 12, 2015
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Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique

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Abstract

Difference atomic pair distribution function methods have been applied to detect and characterize nanoparticles suspended in a solvent at very dilute concentrations. We specifically consider nanoparticles of a pharmaceutical compound in aqueous solution using X-ray PDF methods, a challenging case due to the low atomic number of the nanoparticle species. The nanoparticles were unambiguously detected at the level of 0.25 wt%. Even at these low concentrations the signals were highly reproducible, allowing for reliable detection and quantitative analysis of the nanoparticle structure.

Graphical abstract: Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique

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Publication details

The article was received on 04 Nov 2014, accepted on 13 Feb 2015 and first published on 19 Feb 2015


Article type: Paper
DOI: 10.1039/C4NR06486K
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Citation: Nanoscale, 2015,7, 5480-5487
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    Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique

    M. W. Terban, M. Johnson, M. Di Michiel and S. J. L. Billinge, Nanoscale, 2015, 7, 5480
    DOI: 10.1039/C4NR06486K

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