Domain evolution of tetragonal Pb(ZrxTi1−x) O3 piezoelectric thin films on SrTiO3 (100) surfaces: combined effects of misfit strain and Zr/Ti ratio

Abstract

A series of sol–gel-processed Pb(Zr_xTi_1−x)_0.98Nb_0.02O₃ (x = 0.2, 0.3, 0.4, 0.52) piezoelectric films were epitaxially grown on (100) surfaces of Nb-doped SrTiO₃ single-crystalline substrates to study the composition-dependent domain evolution and corresponding piezoelectricity. The transformation between the 90° a and c domains throughout the tetragonal phase region, together with the variation of piezoelectric property under different excitation signals, were investigated by piezoresponse force microscopy. The observed domain evolution has been well explained by the combined effects of both misfit strain and tetragonality, depending on the Zr/Ti ratio.