Effect of metal/bulk-heterojunction interfacial properties on organic photovoltaic device performance

Abstract

Interfacial properties between evaporated metal contacts and active layer in organic photovoltaic devices critically affect device performance. Through a controlled mechanical delamination method, the interfaces between annealed P3HT:PCBM BHJ layer and Al or Ag electrodes are revealed for direct chemical characterization. The difference in the interfacial, rather than bulk, properties account for the different OPV device performance.