Jump to main content
Jump to site search

Issue 9, 2014
Previous Article Next Article

The controlled fabrication of “Tip-On-Tip” TERS probes

Author affiliations

Abstract

Tip-enhanced near-field Raman spectroscopy has exhibited a great ability to detect in situ chemical and structural information on a sample surface with the highest lateral resolution combined with a high sensitivity at the same time. A key challenge in the TERS field is the development and improvement of the fabrication of reproducible metal tip geometries with a sharper apex. In this study, one novel apertureless “Tip-On-Tip” TERS probe with a special plasmonic nanostructure is designed, and a simple Ar+-ion sputtering route has been developed to fabricate silver nanoneedle arrays on the scanning probe microscopy (SPM) cantilevers for tip-enhanced Raman spectroscopy (TERS) probes. These silver nanoneedles possess a very sharp apex with an apex diameter of 15 nm and an apex angle of 20°. The novel TERS probes exhibit enhanced near-field Raman signals compared to an Ag-coated SPM probe, which are attributed to the intense electromagnetic field around the apexes of the Ag nanoneedles and the periodic structure of the Ag nanoneedles.

Graphical abstract: The controlled fabrication of “Tip-On-Tip” TERS probes

Back to tab navigation

Publication details

The article was received on 21 Aug 2013, accepted on 11 Nov 2013 and first published on 11 Nov 2013


Article type: Paper
DOI: 10.1039/C3RA44532A
RSC Adv., 2014,4, 4718-4722

  •   Request permissions

    The controlled fabrication of “Tip-On-Tip” TERS probes

    Y. Yang, Z. Li, M. Nogami, M. Tanemura and Z. Huang, RSC Adv., 2014, 4, 4718
    DOI: 10.1039/C3RA44532A

Search articles by author

Spotlight

Advertisements