Issue 2, 2014

Nanoscale mechanics by tomographic contact resonance atomic force microscopy

Abstract

We report on quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene–polypropylene (PS–PP) blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of the measured contact stiffness and indentation depth, the depth-dependence of the contact stiffness was analyzed by linear fits to obtain the elastic moduli of the materials probed. Besides elastic moduli, the contributions of adhesive forces (short-range versus long-range) to contact on each material were determined without a priori assumptions. The adhesion analysis was complemented by an unambiguous identification of distinct viscous responses during adhesion and in-contact deformation from the dissipated power during indentation.

Graphical abstract: Nanoscale mechanics by tomographic contact resonance atomic force microscopy

Supplementary files

Article information

Article type
Paper
Submitted
17 Sep 2013
Accepted
01 Nov 2013
First published
05 Nov 2013

Nanoscale, 2014,6, 962-969

Nanoscale mechanics by tomographic contact resonance atomic force microscopy

G. Stan, S. D. Solares, B. Pittenger, N. Erina and C. Su, Nanoscale, 2014, 6, 962 DOI: 10.1039/C3NR04981G

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