Issue 32, 2014

Non-polar InGaN quantum dots grown on the m-plane of n-GaN nanowires by a self-catalyst method using metal organic chemical vapor deposition

Abstract

We propose a novel nanostructure semiconductor which integrated the nanowire (NW) template and the zero dimensional quantum dot (QD) active region. We successfully fabricated InGaN quantum dots on the nonpolar facet of n-GaN NWs via a new self-catalyst method using In droplets. The resultant InGaN QDs were of a quadrangle shape. Their average width and height were 30 and 7 nm, respectively. HR-TEM analysis verified that the InGaN QDs were epitaxially grown on the m-plane facet of n-GaN NWs and had high crystalline quality without any defects. The low-temperature PL spectra of InGaN QDs indicated a prominent emission in the range of 387–425 nm which consisted of several overlapping sharp peaks owing to the different sizes of InGaN QDs. As a result, we expect that this unique InGaN QD growth method can be widely applied to other nanostructure semiconductor systems and that this newly integrated nanostructure semiconductor will be a very promising material for high-quality optoelectronic device applications.

Graphical abstract: Non-polar InGaN quantum dots grown on the m-plane of n-GaN nanowires by a self-catalyst method using metal organic chemical vapor deposition

Supplementary files

Article information

Article type
Paper
Submitted
09 Apr 2014
Accepted
20 Jun 2014
First published
20 Jun 2014

CrystEngComm, 2014,16, 7580-7586

Non-polar InGaN quantum dots grown on the m-plane of n-GaN nanowires by a self-catalyst method using metal organic chemical vapor deposition

H. Yoo, Y. Ra, R. Navamathavan, Y. Choi, J. Park and C. Lee, CrystEngComm, 2014, 16, 7580 DOI: 10.1039/C4CE00743C

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