Issue 27, 2013

Ultrahigh-sensitivity CdS photoconductors with instant response and ultralow power consumption for detection in low-light environments

Abstract

In this study we describe a low-cost cadmium sulfide (CdS) photoconductor that behaves as a highly sensitive and rapidly responding detector toward low-intensity light. Through the observation of TEM images and analysis of micro-Raman spectra, the degree of crystallization of CdS films increased and their dislocation defects were removed effectively after treatment with several shots from a KrF excimer laser. Such laser treatment of CdS photoconductors could be conducted in air and completed within a few seconds. At a very low bias voltage of 1 mV, the laser-treated CdS device provided a record high responsivity of 7200 A W−1 and a detectivity of 1015 Jones. In addition, at a normal bias voltage of 1 V, it displayed an extremely high responsivity of 7 × 106 A W−1 and a detectivity of 6 × 1016 Jones. The measured response time of the laser-annealed CdS device from the dark to illumination at 10−2 fW μm−2 was only 40 ms—much faster than the shutter speed or exposure time required for a professional digital camera for such low-light image detection. Accordingly, KrF laser annealing is a simple and rapid process that can significantly enhance the low-light detection properties of CdS, a commercial photoconductor. Our strategy proposed herein appears to hold great potential for ultralow-light image detection with ultralow power consumption.

Graphical abstract: Ultrahigh-sensitivity CdS photoconductors with instant response and ultralow power consumption for detection in low-light environments

Supplementary files

Article information

Article type
Paper
Submitted
20 Mar 2013
Accepted
17 May 2013
First published
12 Jun 2013

J. Mater. Chem. C, 2013,1, 4244-4251

Ultrahigh-sensitivity CdS photoconductors with instant response and ultralow power consumption for detection in low-light environments

K. Lin, S. Tseng, H. Chen, Y. Lai, S. Chen, Y. Tseng, T. Chu, M. Lin and Y. Lu, J. Mater. Chem. C, 2013, 1, 4244 DOI: 10.1039/C3TC30520A

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