Issue 35, 2013

Towards understanding the electronic structure of Fe-doped CeO2nanoparticles with X-ray spectroscopy

Abstract

This study reports on the electronic structure of Fe-doped CeO2 nanoparticles (NPs), determined by coupled X-ray absorption spectroscopy and X-ray emission spectroscopy. A comparison of the local electronic structure around the Ce site with that around the Fe site indicates that the Fe substitutes for the Ce. The oxygen K-edge spectra that originated from the hybridization between cerium 4f and oxygen 2p states are sensitive to the oxidation state and depend strongly on the concentration of Fe doping. The Ce M4,5-edges and the Fe L2,3-edges reveal the variations of the charge states of Ce and Fe upon doping, respectively. The band gap is further obtained from the combined absorption–emission spectrum and decreased upon Fe doping, implying Fe doping introduces vacancies. The oxygen vacancies are induced by Fe doping and the spectrum reveals the charge transfer between Fe and Ce. Fe3+ doping has two major effects on the formation of ferromagnetism in CeO2 nanoparticles. The first, at an Fe content of below 5%, is that the formation of Fe3+–Vo–Ce3+ introduces oxygen deficiencies favoring ferromagnetism. The other, at an Fe content of over 5%, is the formation of Fe3+–Vo–Fe3+, which favors antiferromagnetism, reducing the Ms. The defect structures Fe3+–Vo–Ce3+ and Fe3+–Vo–Fe3+ are crucial to the magnetism in these NPs and the change in Ms can be described as the effect of competitive interactions of magnetic polarons and paired ions.

Graphical abstract: Towards understanding the electronic structure of Fe-doped CeO2 nanoparticles with X-ray spectroscopy

Article information

Article type
Paper
Submitted
15 May 2013
Accepted
07 Jul 2013
First published
08 Jul 2013

Phys. Chem. Chem. Phys., 2013,15, 14701-14707

Towards understanding the electronic structure of Fe-doped CeO2 nanoparticles with X-ray spectroscopy

W. Wang, S. Chen, P. Glans, J. Guo, R. Chen, K. Fong, C. Chen, A. Gloter, C. Chang, T. Chan, J. Chen, J. Lee and C. Dong, Phys. Chem. Chem. Phys., 2013, 15, 14701 DOI: 10.1039/C3CP52054D

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