Defect evolution on the optical properties of H+-implanted ZnO whiskers
Abstract
The interplay of intentionally doped H impurity with native defects as well as its influence on the microstructure and optical properties of ZnO whiskers was systematically studied by varying the H+ implantation fluencies from 1 × 1014 to 1 × 1016 ions cm−2. Higher dose of H+ implantation resulted in the serious deterioration of the crystallinity and introduction of more nonradiative VO and Zni defects in the energy gap, as revealed by the X-ray diffraction (