Issue 22, 2013
From the journal:

CrystEngComm

Synthesis of mesoporous antimony-doped tin oxide (ATO) thin films and investigation of their electrical conductivity†

Norihiro Suzuki,a   Yuichiro Kamachi,a   Ya-Dong Chiang,b   Kevin C.-W. Wu,b   Shinsuke Ishihara,a   Keisuke Sato,a   Naoki Fukata,a   Mikiya Matsuura,c   Kazuhiko Maekawa,c   Hirofumi Tanabe,c   Katsuhiko Arigaa  and  Yusuke Yamauchi*ade  

* Corresponding authors

a World Premier International (WPI) Research Center, International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
E-mail: YAMAUCHI.Yusuke@nims.go.jp

b Department of Chemical Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Road, Taipei 10617, Taiwan

c Polymer Materials Research Laboratory, Tsukuba Research Center, Kuraray Co., Ltd., 41 Miyukigaoka, Tsukuba, Ibaraki 305-0841, Japan

d Precursory Research for Embryonic Science and Technology (PRESTO), Japan Science and Technology Agency (JST), 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

e Faculty of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku, Tokyo 169-8555, Japan

Abstract

Mesoporous antimony-doped tin oxide (ATO) thin films with crystallized frameworks are synthesized by using a laboratory-made thermally-stable triblock copolymer (named as ‘sulfonated HmSEBmS’) as the template at optimized conditions. The porous structure is strongly affected by the amount of copolymer, which causes variation in the electrical conductivity of the synthesized ATO films.

Graphical abstract: Synthesis of mesoporous antimony-doped tin oxide (ATO) thin films and investigation of their electrical conductivity

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Article information

DOI
https://doi.org/10.1039/C3CE40189H
Article type
Communication
Submitted
28 Jan 2013
Accepted
22 Mar 2013
First published
25 Mar 2013

CrystEngComm, 2013,15, 4404-4407

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Synthesis of mesoporous antimony-doped tin oxide (ATO) thin films and investigation of their electrical conductivity

N. Suzuki, Y. Kamachi, Y. Chiang, K. C.-W. Wu, S. Ishihara, K. Sato, N. Fukata, M. Matsuura, K. Maekawa, H. Tanabe, K. Ariga and Y. Yamauchi, CrystEngComm, 2013, 15, 4404 DOI: 10.1039/C3CE40189H

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