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Issue 27, 2012
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A direct observation of nanometer-size void dynamics in an ultra-thin water film

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Abstract

Here we report the direct dynamic observation of electron beam induced nucleation of nanometer-diameter voids in a thin water film (<12 nm) on a hydrophilic substrate using an in situ TEM platform tailored towards imaging of liquids. The growth dynamics of these nano-voids in a thin water film reveal that there is a critical diameter below which voids are unstable and close up. However, the coalescence of several of such small and unstable voids allows for pathway to form larger and stable voids. A simple model based on the minimization of free energy explains our experimental observations.

Graphical abstract: A direct observation of nanometer-size void dynamics in an ultra-thin water film

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Publication details

The article was received on 14 Feb 2012, accepted on 14 May 2012 and first published on 11 Jun 2012


Article type: Communication
DOI: 10.1039/C2SM25331C
Citation: Soft Matter, 2012,8, 7108-7111
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    A direct observation of nanometer-size void dynamics in an ultra-thin water film

    U. Mirsaidov, C. Ohl and P. Matsudaira, Soft Matter, 2012, 8, 7108
    DOI: 10.1039/C2SM25331C

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