Issue 4, 2012
From the journal:

Soft Matter

The piezoresponse force microscopy investigation of self-polarization alignment in poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films

Moonkyu Park,a   Yoon-Young Choi,a   Jiyoon Kim,a   Jongin Hong,*b   Han Wook Song,c   Tae-Hyun Sungd  and  Kwangsoo No*a  

* Corresponding authors

a Department of Materials Science and Engineering, KAIST, Daejeon, Korea
E-mail: ksno@kaist.ac.kr
Fax: +82 42 350 3310
Tel: +82 42 350 4156

b Department of Chemistry, Chung-Ang University, Seoul, Korea
E-mail: hongj@cau.ac.kr
Fax: +82 2 825 4736
Tel: +82 2 820 5869

c Group of Standard and Basis Metrology, Korea Research Institute of Standard and Science, Daejeon, Korea

d Department of Electrical Engineering, Hanyang University, Seoul, 17 Haengdang-dong, Korea

Abstract

We report the self-polarization alignment without external poling in spin-coated poly(vinylidene fluoride-co-trifluoroethylene), P(VDF-TrFE), thin films on transparent and flexible substrates. Piezoresponse force microscopy (PFM) allows the quantitative analysis of preferentially aligned polarization in the ferroelectric thin films. We found that as-received P(VDF-TrFE) thin films on transparent poly(3,4-ethylenedioxythiophene):poly(4-styrenesulfonate) (PEDOT:PSS) electrodes showed stronger self-polarization alignment than those on indium-tin oxide (ITO) electrodes. The relative ratios for the aligned polarization per unit volume on PEDOT:PSS and ITO electrodes were 18.6% and 4%, respectively.

Graphical abstract: The piezoresponse force microscopy investigation of self-polarization alignment in poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films

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Article information

DOI
https://doi.org/10.1039/C1SM05950E
Article type
Paper
Submitted
22 May 2011
Accepted
23 Sep 2011
First published
23 Nov 2011

Soft Matter, 2012,8, 1064-1069

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The piezoresponse force microscopy investigation of self-polarization alignment in poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films

M. Park, Y. Choi, J. Kim, J. Hong, H. W. Song, T. Sung and K. No, Soft Matter, 2012, 8, 1064 DOI: 10.1039/C1SM05950E

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