Issue 8, 2012

Nanoscale investigation of the electrical properties in semiconductor polymer–carbon nanotube hybrid materials

Abstract

The morphology and electrical properties of hybrids of a semiconducting polymer (namely poly(3-hexylthiophene) P3HT) and carbon nanotubes are investigated at the nanoscale with a combination of Scanning Probe Microscopy techniques, i.e., Conductive Atomic Force Microscopy (C-AFM) and time-resolved Current Sensing Force Spectroscopy Atomic Force Microscopy (CSFS-AFM, or PeakForce TUNA™). This allows us to probe the electrical properties of the 15 nm wide P3HT nanofibers as well as the interface between the polymer and single carbon nanotubes. This is achieved by applying controlled, low forces on the tip during imaging, which allows a direct comparison between the morphology and the electrical properties at the nanometre scale.

Graphical abstract: Nanoscale investigation of the electrical properties in semiconductor polymer–carbon nanotube hybrid materials

Supplementary files

Article information

Article type
Paper
Submitted
01 Dec 2011
Accepted
15 Feb 2012
First published
21 Feb 2012

Nanoscale, 2012,4, 2705-2712

Nanoscale investigation of the electrical properties in semiconductor polymercarbon nanotube hybrid materials

S. Desbief, N. Hergué, O. Douhéret, M. Surin, P. Dubois, Y. Geerts, R. Lazzaroni and P. Leclère, Nanoscale, 2012, 4, 2705 DOI: 10.1039/C2NR11888B

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