Issue 43, 2012
From the journal:

Journal of Materials Chemistry

Large-scale patterning by the roll-based evaporation-induced self-assembly

Won Kyu Park,†ab   TaeYoung Kim,†a   Hyeongkeun Kim,a   Yena Kim,a   Tran Thanh Tung,c   Zhiqun Lin,d   A-Rang Jang,e   Hyeon Suk Shin,e   Jong Hun Han,f   Dae Ho Yoon*b  and  Woo Seok Yang*a  

* Corresponding authors

a Electronic Materials and Device Research Center, Korea Electronics Technology Institute, Seongnam 463-816, Republic of Korea
E-mail: wsyang@keti.re.kr

b School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea

c Smart Plastics Group, European University of Brittany, LIMATB-UBS, Lorient, France

d School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA

e Interdisciplinary School of Green Energy, Low Dimensional Carbon Materials Center and KIER-UNIST Advanced Center for Energy, Ulsan National Institute of Science and Technology (UNIST), Ulsan 689-805, Korea

f School of Applied Chemical Engineering, Chonnam National University, Gwangju 500-575, Korea

Abstract

The large-scale fabrication of highly regular polymer stripes was achieved either on rigid or flexible substrates via the roll-based evaporation-induced self-assembly (EISA) method. A control of stripe size was rendered by an adjustment of the jig speed and the polymer concentration. Large-scale graphene stripes on a flexible substrate were also crafted by capitalizing on an optimized condition of the roll-based EISA technique.

Graphical abstract: Large-scale patterning by the roll-based evaporation-induced self-assembly

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Article information

DOI
https://doi.org/10.1039/C2JM34212J
Article type
Communication
Submitted
29 Jun 2012
Accepted
17 Sep 2012
First published
24 Sep 2012

J. Mater. Chem., 2012,22, 22844-22847

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Large-scale patterning by the roll-based evaporation-induced self-assembly

W. K. Park, T. Kim, H. Kim, Y. Kim, T. T. Tung, Z. Lin, A. Jang, H. S. Shin, J. H. Han, D. H. Yoon and W. S. Yang, J. Mater. Chem., 2012, 22, 22844 DOI: 10.1039/C2JM34212J

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