Annealing treatment for restoring and controlling the interface morphology of organic photovoltaic cells with interfacial sputtered ZnO films on P3HT:PCBM active layers

Abstract

In this paper, we report on the photovoltaic properties of conventional organic photovoltaic solar cells integrating a sputtered ZnO interfacial film deposited on the absorber P3HT:PCBM layer. An emphasis has been put on the influence of the annealing temperature and time for restoring and controlling the P3HT:PCBM/ZnO interface morphology, which can be damaged by the sputtering process. We show a significant improvement in the current–voltage (J–V) characteristics upon annealing up to 160 °C. This is evidenced by the reduction of the S-shape of these curves systematically observed for the cells integrating thick (100 nm) sputtered ZnO films. This approach was also highlighted on cells containing thinner (20 nm) ZnO films using a longer annealing process at 140 °C, which led to a significant improvement of the power conversion efficiency compared with the value recorded in as-prepared cells or in cells with no interfacial ZnO layer. These photovoltaic performances have been related to the change of the morphology of the absorber layer and to the vertical phase segregation of P3HT:PCBM at the interface with ZnO. Optical microscopy, scanning electron microscopy and atomic force microscopy have been performed in order to confirm this approach.