Jump to main content
Jump to site search

Issue 39, 2012

Layer resolved evolution of the optical properties of α-sexithiophene thin films

Author affiliations

Abstract

We report a combined reflectance difference spectroscopy and scanning tunneling microscopy study of ultrathin α-sexithiophene (6T) films deposited on the Cu(110)-(2×1)O surface. The correlation between the layer resolved crystalline structure and the corresponding optical spectra data reveals a highly sensitive dependence of the excitonic optical properties on the layer thickness and crystalline structure of the 6T film.

Graphical abstract: Layer resolved evolution of the optical properties of α-sexithiophene thin films

Article information


Submitted
04 Jul 2012
Accepted
20 Aug 2012
First published
20 Aug 2012

Phys. Chem. Chem. Phys., 2012,14, 13651-13655
Article type
Paper

Layer resolved evolution of the optical properties of α-sexithiophene thin films

L. Sun, S. Berkebile, G. Weidlinger, M. Denk, R. Denk, M. Hohage, G. Koller, F. P. Netzer, M. G. Ramsey and P. Zeppenfeld, Phys. Chem. Chem. Phys., 2012, 14, 13651 DOI: 10.1039/C2CP42270K

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.


Social activity

Search articles by author

Spotlight

Advertisements