Layer resolved evolution of the optical properties of α-sexithiophene thin films

Lidong Sun; Stephen Berkebile; Günther Weidlinger; Mariella Denk; Richard Denk; Michael Hohage; Georg Koller; Falko P. Netzer; Michael G. Ramsey; Peter Zeppenfeld

doi:10.1039/C2CP42270K

Layer resolved evolution of the optical properties of α-sexithiophene thin films

Lidong Sun,*^a Stephen Berkebile,^b Günther Weidlinger,^a Mariella Denk,^a Richard Denk,^a Michael Hohage,^a Georg Koller,^b Falko P. Netzer,^b Michael G. Ramsey^b and Peter Zeppenfeld^a

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^a Institute of Experimental Physics, Johannes Kepler University Linz, Altenbergerstraße 69, A-4040 Linz, Austria
E-mail: lidong.sun@jku.at

^b Institute of Physics, Karl-Franzens Universität Graz, Universitätsplatz 5, A-8010 Graz, Austria

Abstract

We report a combined reflectance difference spectroscopy and scanning tunneling microscopy study of ultrathin α-sexithiophene (6T) films deposited on the Cu(110)-(2×1)O surface. The correlation between the layer resolved crystalline structure and the corresponding optical spectra data reveals a highly sensitive dependence of the excitonic optical properties on the layer thickness and crystalline structure of the 6T film.

Physical Chemistry Chemical Physics

Layer resolved evolution of the optical properties of α-sexithiophene thin films

Abstract

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Layer resolved evolution of the optical properties of α-sexithiophene thin films

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