Rayleigh instability induced SiC/SiO2 necklace like nanostructures
Abstract
SiC@SiO2 nanocables (NCs) were annealed under a
- This article is part of the themed collection: Nanocrystals
* Corresponding authors
a
Institut Européen des Membranes (IEM, ENSCM, CNRS, UM2, UMR 5635), Université Montpellier 2, Place Eugène Bataillon, Montpellier, France
E-mail:
mikhael.bechelany@univ-montp2.fr
Fax: +33 467149119
Tel: +33 467149167
b Nuclear Fuels and Materials Division, Idaho National Laboratory, P.O. Box 1625, USA
c Laboratoire des Multimatériaux et Interfaces UMR 5615 CNRS - Université Lyon 1, Université de Lyon, 43 bd du 11 novembre 1918, Villeurbanne, France
SiC@SiO2 nanocables (NCs) were annealed under a
M. Bechelany, J. L. Riesterer, A. Brioude, D. Cornu and P. Miele, CrystEngComm, 2012, 14, 7744 DOI: 10.1039/C2CE25636C
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