Issue 17, 2012

Growth of preferential orientation of MIL-53(Al) film as nano-assembler

Abstract

A thin film of MIL-53(Al) on the activated Al slice has been prepared successfully. The crystals in the films exhibit high phase purity and a preferential orientation with straight channel network (or (h0l) planes) of the crystals parallel to the support surface, which are studied by X-ray diffraction (XRD), scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The loading of organic (2-(2-hydroxyphenyl)-pyridine) (PP) fluorescent molecules in the film has been accomplished. The behaviours of the fluorescent molecules assembled in the pores of the oriented crystals are probed by Fourier transform infrared (FT-IR) and fluorescence spectroscopies.

Graphical abstract: Growth of preferential orientation of MIL-53(Al) film as nano-assembler

Supplementary files

Article information

Article type
Paper
Submitted
05 Mar 2012
Accepted
20 May 2012
First published
23 May 2012

CrystEngComm, 2012,14, 5487-5492

Growth of preferential orientation of MIL-53(Al) film as nano-assembler

F. Zhang, X. Zou, F. Sun, H. Ren, Y. Jiang and G. Zhu, CrystEngComm, 2012, 14, 5487 DOI: 10.1039/C2CE25318F

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