Elemental and molecular speciation of lead particles by dynamic C-60 secondary ion mass spectrometry†
Abstract
In this work, dynamic C60+
* Corresponding authors
a
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
E-mail:
timothy.brewer@nist.gov
In this work, dynamic C60+
T. M. Brewer and L. T. Demoranville, Anal. Methods, 2012, 4, 3491 DOI: 10.1039/C2AY25676B
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