- Article type
- 27 Oct 2010
- 10 Nov 2010
- First published
- 29 Nov 2010
Morphological impact of
zinc oxide layers on the device performance in thin-film transistors
H. Faber, M. Klaumünzer, M. Voigt, D. Galli, B. F. Vieweg, W. Peukert, E. Spiecker and M. Halik, Nanoscale, 2011, 3, 897 DOI: 10.1039/C0NR00800A
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