Electric field-induced nanopatterning of reduced graphene oxide on Si and a p–n diode junction†
Abstract
Electric field-induced (EFI)
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* Corresponding authors
a
NCRI, Center for Smart Molecular Memory, Department of Chemistry, Sungkyunkwan University, Suwon, Korea
E-mail:
hyoyoung@skku.edu
Fax: +82 31 290 5934
Tel: +82 31 299 4566
b Department of Chemistry, Sungkyunkwan University, Suwon, Korea
Electric field-induced (EFI)
S. Seo, C. Jin, Y. R. Jang, J. Lee, S. K. Kim and H. Lee, J. Mater. Chem., 2011, 21, 5805 DOI: 10.1039/C0JM03939J
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