Issue 11, 2011

Effect of damping force on CIT and QIT ion traps supplied with a periodic impulse voltage form

Abstract

The behavior of confined ions under a damping force based on laser or collisional cooling is of particular importance in different disciplines especially in high resolution mass spectrometry. The significance of the effect of the damping force on confined ions in a cylindrical ion trap has not been yet investigated, so, in this article a cylindrical ion trap excited with a periodic impulse voltage of the form f(t) = V0cosΩt/(1 − kcost) with 0 ≤ k < 1 is studied and compared to the quadrupole ion trap with and without the effect of damping force. Numerical computations allowed the determination of the twelve stability diagrams using fifth order Runge–Kutta derivative approximations. The physical properties of the confined ions in the r and z axis are illustrated and the effect of damping force on the fractional mass resolutions mm of the confined ions in two first and second stability regions of both ion traps was analyzed.

Graphical abstract: Effect of damping force on CIT and QIT ion traps supplied with a periodic impulse voltage form

Article information

Article type
Paper
Submitted
03 Jun 2011
Accepted
26 Jul 2011
First published
28 Sep 2011

J. Anal. At. Spectrom., 2011,26, 2247-2256

Effect of damping force on CIT and QIT ion traps supplied with a periodic impulse voltage form

S. M. S. Kiai, S. S. Chaharborj, M. R. A. Bakar and I. Fudziah, J. Anal. At. Spectrom., 2011, 26, 2247 DOI: 10.1039/C1JA10170F

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