Photoinduced hole trapping in single semiconductor quantum dots at specific sites at silicon oxide interfaces
Abstract
Blinking dynamics of
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* Corresponding authors
a
Institute of Physics and nanoMA (Centre for nanostructured Materials and Analytics), Chemnitz University of Technology, 09107 Chemnitz, Germany
E-mail:
cornelius.krasselt@physik.tu-chemnitz.de
Fax: +49 (0)371 531 837174
Tel: +49 (0)371 531 37174
Blinking dynamics of
C. Krasselt, J. Schuster and C. von Borczyskowski, Phys. Chem. Chem. Phys., 2011, 13, 17084 DOI: 10.1039/C1CP22040C
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