High temperature Raman spectroscopy study on the microstructure of the boundary layer around a growing LiB3O5 crystal
Abstract
High temperature
* Corresponding authors
a
Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, China
E-mail:
smwan@aiofm.ac.cn
Fax: +86 0551 5591039
Tel: +86 0551 5591039
b School of Material Science and Engineering, Shanghai University, Shanghai, China
c Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, China
High temperature
D. Wang, S. Wan, S. Yin, Q. Zhang, J. You, G. Zhang and P. Fu, CrystEngComm, 2011, 13, 5239 DOI: 10.1039/C1CE05375B
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