Issue 10, 2010

Additive nanoscale embedding of functional nanoparticles on silicon surface

Abstract

We present a novel additive process, which allows the spatially controlled integration of nanoparticles (NPs) inside silicon surfaces. The NPs are placed between a conductive stamp and a silicon surface; by applying a bias voltage a SiO2 layer grows underneath the stamp protrusions, thus embedding the particles. We report the successful nanoembedding of CoFe2O4 nanoparticles patterned in lines, grids and logic structures.

Graphical abstract: Additive nanoscale embedding of functional nanoparticles on silicon surface

Supplementary files

Article information

Article type
Communication
Submitted
10 May 2010
Accepted
02 Jul 2010
First published
09 Aug 2010

Nanoscale, 2010,2, 2069-2072

Additive nanoscale embedding of functional nanoparticles on silicon surface

M. Cavallini, F. C. Simeone, F. Borgatti, C. Albonetti, V. Morandi, C. Sangregorio, C. Innocenti, F. Pineider, E. Annese, G. Panaccione and L. Pasquali, Nanoscale, 2010, 2, 2069 DOI: 10.1039/C0NR00315H

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