Electron transport in high-resistance semiconductor nanowires through two-probe measurements
Abstract
Since the successful fabrication of semiconductor
* Corresponding authors
a
Department of Electrophysics, National Chiao Tung University, Hsinchu 30010, Taiwan
E-mail:
wbjian@mail.nctu.edu.tw
b Department of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, Taiwan
c Department of Chemistry, State University of New York at Binghamton, Binghamton, New York 13902-6000, USA
Since the successful fabrication of semiconductor
Y. Lin, T. Chen, C. Chang, Y. Chang, Y. Chiu, H. Hung, J. Kai, Z. Liu, J. Fang and W. Jian, Phys. Chem. Chem. Phys., 2010, 12, 10928 DOI: 10.1039/C0CP00038H
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