Boundary effects on the electrical conductivity of pure and doped cerium oxide thin films†
Abstract
Thin films of CeO2 (both nominally pure and 10 mol% gadolinium-doped) grown via
* Corresponding authors
a
Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, D-70569 Stuttgart, Germany
E-mail:
g.gregori@fkf.mpg.de, s.weiglein@fkf.mpg.de
Fax: +49 711-689-1722
b Key Laboratory of Transparent and Opto-functional Inorganic Materials, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
Thin films of CeO2 (both nominally pure and 10 mol% gadolinium-doped) grown via
M. C. Göbel, G. Gregori, X. Guo and J. Maier, Phys. Chem. Chem. Phys., 2010, 12, 14351 DOI: 10.1039/C0CP00385A
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