Issue 37, 2010

Dynamics in the excited electronic state of periodic mesoporous biphenylylene-silica studied by time-resolved diffuse reflectance and fluorescence spectroscopy

Abstract

The excited state dynamics of periodic mesoporous organosilica (powder) bearing biphenylylene moieties densely in the silica framework (Bp-PMO) is investigated for the first time using femtosecond time-resolved diffuse reflectance (TDR) and picosecond time-resolved fluorescence spectroscopies. The TDR spectra revealed the excitation-relaxation process of the biphenylylene moieties, including the relaxation of the twisted Frank-Condon (FC) state to the lowest singlet excited state (S1) with a time constant of 730 ± 95 fs, and efficient quenching of the S1 state by excimer (E) formations with two time constants of 7.0 ± 0.2 ps (E1: ca. 64%) and 170 ± 47 ps (E2 and E3: ca. 36%). The individual absorption spectra of the FC, S1, and E states were reconstructed by the TDR spectral analysis. The time-resolved fluorescence spectra showed that the excimers decayed with three time constants of 1.3 ± 0.2 ns (E1), 8.2 ± 0.7 ns (E2) and 27 ± 2 ns (E3). The fluorescence quantum yields of the excimers are suggested to be almost zero for E1, and unity for E2 and E3, which implies that the fluorescence quantum yield of Bp-PMO (ΦF = 0.38) can be explained by the fraction of the highly emissive excimers (E2 and E3). The excited state dynamics of Bp-PMO is quite different from those of a solution of 4,4′-bis-(triethoxysilyl)biphenyl precursor and a biphenyl molecular crystal (powder).

Graphical abstract: Dynamics in the excited electronic state of periodic mesoporous biphenylylene-silica studied by time-resolved diffuse reflectance and fluorescence spectroscopy

Supplementary files

Article information

Article type
Paper
Submitted
15 Mar 2010
Accepted
28 May 2010
First published
11 Aug 2010

Phys. Chem. Chem. Phys., 2010,12, 11688-11696

Dynamics in the excited electronic state of periodic mesoporous biphenylylene-silica studied by time-resolved diffuse reflectance and fluorescence spectroscopy

K. Yamanaka, T. Okada, Y. Goto, T. Tani and S. Inagaki, Phys. Chem. Chem. Phys., 2010, 12, 11688 DOI: 10.1039/C004255B

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