Issue 8, 2010
From the journal:

Analyst

Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation

Shinsuke Kunimura*a  and  Jun Kawaib  

* Corresponding authors

a Materials Fabrication Laboratory, RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama, Japan
E-mail: kunimura@riken.jp
Fax: +81-48-462-4657
Tel: +81-48-467-9318

b Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, Japan

Abstract

Detection limits obtained by a portable total reflection X-ray fluorescence (TXRF) spectrometer with or without a monochromator are compared. A 1 W X-ray tube (tube voltage: 20 kV) is used in this spectrometer. Polychromatic excitation improves the detection limits in TXRF analysis with the low power X-ray tube compared with monochromatic excitation. A detection limit of 26 pg is achieved for Co when using the weak polychromatic X-rays.

Graphical abstract: Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation

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Article information

DOI
https://doi.org/10.1039/C0AN00009D
Article type
Communication
Submitted
17 Jan 2010
Accepted
26 May 2010
First published
09 Jun 2010

Analyst, 2010,135, 1909-1911

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Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation

S. Kunimura and J. Kawai, Analyst, 2010, 135, 1909 DOI: 10.1039/C0AN00009D

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