A simple, rapid and reliable method for the determination of Al, Ca, Cr, Cu, Fe, Mg, Mn, Na, Ni, Si, Ti, V and Zr in high purity boron carbide (B4C) using slurry introduction axial viewed inductively coupled plasma optical emission spectrometry (ICP-OES) is described. The sample slurry was prepared by directly dispersing the powdery boron carbide in an aqueous solution without dispersant addition. The accuracy was verified by comparison of the results with those obtained by various other methods and the value of certified reference material ERM-ED 102 (boron carbide powder). Owing to a rather low contamination in the sample preparation and stability of the slurry, the LODs, which were in the range of 0.02–2 µg g−1, were superior to those of the conventional nebulization ICP-OES technique or solid dc-OES.
You have access to this article
Please wait while we load your content...
Something went wrong. Try again?