Sulfur-induced offsets in MC-ICP-MS silicon-isotope measurements
Abstract
* Corresponding authors
a Department of Earth Sciences, Utrecht University, Budapestlaan 4, Utrecht, The Netherlands
b
Faculty of Earth and Life Sciences, Vrije Universiteit, De Boelelaan 1085, Amsterdam, The Netherlands
E-mail:
pieter.vroon@ falw.vu.nl
Tel: (+31) (0)20 5987404
S. H. J. M. van den Boorn, P. Z. Vroon and M. J. van Bergen, J. Anal. At. Spectrom., 2009, 24, 1111 DOI: 10.1039/B816804K
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