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Issue 11, 2008
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Direct chromium speciation in solid state materials—a GDMS approach

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Abstract

Among the various elemental mass spectrometry techniques, glow discharge mass spectrometry is recognized for its ability to provide direct determination of trace elements present in solid state samples. In the present work, a pulsed glow discharge time-of-flight mass spectrometry method is developed for the direct speciation of chromium in solid state samples. The millisecond pulsed glow discharge operated with radio frequency power is a versatile ion source that provides elemental, structural and molecular information. Careful tuning of the operating parameters yields the plasma chemistry that favors cluster ion formation. Cluster ions unique to specific species permit differentiation between the trivalent and hexavalent forms of chromium, (Cr(III) and (Cr(VI)), respectively, in chromium oxide samples. Specifically, signals at 104 and 120 m/z corresponding to the Cr2+ and Cr2O+ cluster ions arise from the presence of Cr(III) in the sample, whereas signal at 100 m/z corresponding to the CrO3+cluster ion arises from the presence of Cr(VI). The impact of glow discharge operating conditions on the appearance of these characteristic cluster ions is discussed.

Graphical abstract: Direct chromium speciation in solid state materials—a GDMS approach

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Article information


Submitted
27 Feb 2008
Accepted
10 Jul 2008
First published
28 Aug 2008

J. Anal. At. Spectrom., 2008,23, 1508-1517
Article type
Paper

Direct chromium speciation in solid state materials—a GDMS approach

J. N. Robertson-Honecker, N. Zhang, A. Pavkovich and F. L. King, J. Anal. At. Spectrom., 2008, 23, 1508
DOI: 10.1039/B803358G

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