Quantitative analysis of silicate certified reference materials by LA-ICPMS with and without an internal standard
Abstract
Quantitative analysis of
* Corresponding authors
a
Department of Earth & Environmental Sciences, University of Windsor, Windsor, Ontario, Canada
E-mail:
jgagnon@uwindsor.ca
Fax: +1-519-973-7081
Tel: +1-519-253-3000
b
Department of Earth & Planetary Sciences, McGill University, Montreal, Quebec, Canada
Fax: +1-514-398-4680
Tel: +1-514-398-6767
Quantitative analysis of
J. E. Gagnon, B. J. Fryer, I. M. Samson and A. E. Williams-Jones, J. Anal. At. Spectrom., 2008, 23, 1529 DOI: 10.1039/B801807N
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