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Volume 137, 2008
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Elastic light scattering from free sub-micron particles in the soft X-ray regime

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Abstract

We report the first experimental results on angle-resolved elastic light scattering in the soft X-ray regime, where free sub-micron particles in the size regime between 150 and 250 nm are studied in the gas phase by using a continuous particle beam. Two different types of studies are reported: (i) Angle-resolved elastic light scattering experiments provide specific information on the scattering patterns in the regime of element-selective inner-shell excitation near the Si 2p-edge (80–150 eV). In addition to intense forward scattering, we observe distinct features in the angle-resolved scattering patterns. These are modelled by using Mie theory as well as a model that includes contributions from diffuse and specular reflection. The results are primarily attributed to scattering from soft X-rays in the surface layer. (ii) Spectroscopic experiments are reported, where the photon detector is placed at a given scattering angle while scanning the photon energy near the Si 2p-absorption edge. These results are also analyzed by a Mie model, yielding accurate information of the size distribution.

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Publication details

The article was received on 21 Feb 2007, accepted on 19 Mar 2007 and first published on 30 Jul 2007


Article type: Paper
DOI: 10.1039/B702630G
Citation: Faraday Discuss., 2008,137, 389-402
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    Elastic light scattering from free sub-micron particles in the soft X-ray regime

    H. Bresch, B. Wassermann, B. Langer, C. Graf, R. Flesch, U. Becker, B. Österreicher, T. Leisner and E. Rühl, Faraday Discuss., 2008, 137, 389
    DOI: 10.1039/B702630G

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