Issue 33, 2008
From the journal:

Chemical Communications

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens,ab   Pablo Cubillas,a   Kjell Jansson,b   Osamu Terasaki,b   Michael W. Anderson,*a   Paul A. Wrightc  and  María Castroc  

* Corresponding authors

a Centre for Nanoporous Materials, School of Chemistry, The University of Manchester, Chemistry Building, Oxford Road, Manchester, UK
E-mail: sammichaelstevens@mac.com
Fax: +44 161 275 4598
Tel: +44 161 306 4527

b Structural Chemistry, Arrhenius Laboratory, Stockholm University, Stockholm, Sweden
Fax: +46 8 16 3118
Tel: +46 8 16 2379

c School of Chemistry, University of St. Andrews, Purdie Building, North Haugh, St. Andrews, Fife, UK
Fax: +44 133 446 3808
Tel: +44 133 446 3793

Abstract

The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

Graphical abstract: Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

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Article information

DOI
https://doi.org/10.1039/B804440F
Article type
Communication
Submitted
14 Mar 2008
Accepted
07 May 2008
First published
26 Jun 2008

Chem. Commun., 2008, 3894-3896

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Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

S. M. Stevens, P. Cubillas, K. Jansson, O. Terasaki, M. W. Anderson, P. A. Wright and M. Castro, Chem. Commun., 2008, 3894 DOI: 10.1039/B804440F

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